in-Netherlands · Makkinarju, apparat u oġġetti elettriċi
Titlu uffiċjali · Nederlands
Traduzzjoni awtomatika indikattiva biex tiffaċilita l-qari. It-titlu uffiċjali hawn taħt jipprevali.
Titlu uffiċjali · Nederlands
Metrology SEM+FIB system
Id-data hija ristrutturata biex tinqara aktar faċilment. L-avviż uffiċjali u d-dokumenti tal-akkwist dejjem jipprevalu.
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO · in-Netherlands
Ara avviżi taħt dan l-isemSommarju uffiċjali · Nederlands
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Traduzzjoni awtomatika indikattiva. Is-sommarju uffiċjali jibqa’ r-referenza.
The main purpose of this FIB/SEM equipment is to perform material milling (cutting), 3D characterization, and cross section analysis of epitaxially grown InP, InGaAs, InAlGaAs and InGaAsP layers on InP substrates. The structures may also contain polymer-based planarization layers, SiOx or SiNx dielectric layers and TiPtAu or NiGeAu metal layers. Levering van één SEM +FIB systeem
Storja tal-avviżi
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S’issa ma ġie identifikat l-ebda avviż ieħor relatat.
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TED · 519634-2026. Iċċekkjat fil-24 Aww 2026 04:05.
Id-data hija ristrutturata biex tinqara aktar faċilment. L-avviż uffiċjali u d-dokumenti tal-akkwist dejjem jipprevalu.
