Official summary
What is being procured?
Atomic Force Microscope (AFM) for the characterization of film samples and surfaces under both dry conditions and in liquid environments.
Source and reliability
Source: official TED notice 502702-2026, last checked Aug 21, 2026, 3:05 PM. The original publication remains authoritative.
Data is restructured for easier reading. The official notice and procurement documents always prevail.