Achoimre oifigiúil · English
Cad atá á sholáthar?
University College Cork request the supply of a Total Reflection X-ray Fluorescence (TXRF) Analysis Spectrometer for non-destructive, trace-level wafer surface contamination analysis, with automated handling and rapid full-wafer mapping. The system must support routine monitoring on 100 mm and up to 200 mm wafers and be compatible with bare and processed wafers including thin films, epitaxial layers, and compound semiconductor substrates. The Spectrometer must be suitable for in a research cleanroom environment, with robust software control, recipe management, and data export.
Meaisínaistriúchán mar threoir. Is í an achoimre oifigiúil an tagairt údarásach.
Achoimre oifigiúil · English
University College Cork request the supply of a Total Reflection X-ray Fluorescence (TXRF) Analysis Spectrometer for non-destructive, trace-level wafer surface contamination analysis, with automated handling and rapid full-wafer mapping. The system must support routine monitoring on 100 mm and up to 200 mm wafers and be compatible with bare and processed wafers including thin films, epitaxial layers, and compound semiconductor substrates. The Spectrometer must be suitable for in a research cleanroom environment, with robust software control, recipe management, and data export.
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Amlíne an tsoláthair
Lean na príomhchéimeanna agus na nuashonruithe a bhaineann leis an nós imeachta soláthair seo.
Tá na sonraí athstruchtúrtha chun iad a léamh níos éasca. Is iad an fógra oifigiúil agus na doiciméid soláthair a bhíonn i réim i gcónaí.
Foinse agus iontaofacht
TED · 271168-2026. Seiceáilte ar 21 Lún 2026 22:05.
Tá na sonraí athstruchtúrtha chun iad a léamh níos éasca. Is iad an fógra oifigiúil agus na doiciméid soláthair a bhíonn i réim i gcónaí.