Denmark · Laboratory, optical and precision equipment
Official title · English
The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source
Danmarks Tekniske Universitet - DTU
The official notice does not provide a concise description in this language.
- Deadline
- Nov 16, 2026 07:00 UTC
- Estimated value
- Not announced