Official summary · Deutsch
What is being procured?
200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Machine translation for guidance. The official summary remains authoritative.
Official summary · Deutsch
200 mm Semi-Automatic RF Probe System for On-Wafer Measurements up to 250 GHz
Notice history
Procurement timeline
Follow the main stages and updates linked to this procurement procedure.
No other related notice has been identified yet.
Data is restructured for easier reading. The official notice and procurement documents always prevail.
Source and reliability
TED · 432100-2026. Checked on Aug 23, 2026, 6:05 AM.
Data is restructured for easier reading. The official notice and procurement documents always prevail.