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Titlu uffiċjali · Deutsch

Semi-automatic prober for characterization of 200 mm wafers

IHP GmbH - Leibniz-Institut für innovative Mikroelektronik · il-Ġermanja

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Sommarju uffiċjali · Deutsch

Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes…

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Skadenza 13 Ott 2026 12:00 UTC+02:00
Valur stmatMhux imħabbar
Ippubblikat14 Set 2026
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vergabemarktplatz.brandenburg.de

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Sommarju uffiċjali · Deutsch

X’qed jiġi akkwistat?

Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training and integration support.

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    · TED 631856-2026

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TED · 631856-2026. Iċċekkjat fil-14 Set 2026 11:05.

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