Officielt resumé · Deutsch
Hvad indkøbes?
Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training and integration support.
Vejledende maskinoversættelse. Det officielle resumé er fortsat gældende.
Officielt resumé · Deutsch
Supply, delivery, installation, commissioning and integration of a semi-automatic wafer prober system for the electrical and temperature-dependent characterization of 200 mm wafers. The system shall support DC and pulsed I-V as well as low-frequency impedance measurements up to 10 MHz and shall be integrated with the existing Keithley 4200A-SCS characterization system. The scope includes the prober, temperature-controlled chuck, electrical probes, optical and camera systems, control hardware and software, cabling and interfaces, installation, commissioning, operator training and integration support.
Meddelelseshistorik
Udbudsforløb
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Kilde og pålidelighed
TED · 631856-2026. Kontrolleret 14. sep. 2026 11.05.
Data er omstruktureret for at være lettere at læse. Den officielle meddelelse og udbudsdokumenterne er altid gældende.