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Germany · Laboratory, optical and precision equipment

Official title · Deutsch

Semi-Automatic Wafer Prober System for Characterization of 200-mm Wafers

IHP GmbH - Lebniz-Institut für innovative Mikroelektronik · Germany

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Official summary · Deutsch

The subject of the procurement is the supply, installation and commissioning of a semi-automatic wafer prober system for the electrical and high-frequency characterization of 200-mm wafers for research and laboratory use at IHP. The system shall include, among other components, a 200-mm wafer prober with vacuum chuck and precision positioning, individual probes, multi-contact probes for RF measurements up to at least 6 GHz, a probe card system, automated…

What is being procured?
Deadline Oct 29, 2026 12:00 UTC+01:00
Estimated valueNot announced
PublishedSep 29, 2026
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vergabemarktplatz.brandenburg.de

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Official summary · Deutsch

What is being procured?

The subject of the procurement is the supply, installation and commissioning of a semi-automatic wafer prober system for the electrical and high-frequency characterization of 200-mm wafers for research and laboratory use at IHP. The system shall include, among other components, a 200-mm wafer prober with vacuum chuck and precision positioning, individual probes, multi-contact probes for RF measurements up to at least 6 GHz, a probe card system, automated microscopy and camera equipment, as well as control and software components. The scope of supply also includes transport, installation, commissioning, training, documentation, warranty and spare-parts supply.

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TED · 670077-2026. Checked on Sep 29, 2026, 11:05 AM.
https://ted.europa.eu/de/notice/-/detail/670077-2026

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TED · 670077-2026. Checked on Sep 29, 2026, 11:05 AM.

Data is restructured for easier reading. The official notice and procurement documents always prevail.

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