Awarded TED · Source · Language: Nederlands

Netherlands · Laboratory, optical and precision equipment

Official title · Nederlands

11835 - Field-Emission Scanning Electron Microscope (FE-SEM)

Technische Universiteit Delft · Netherlands

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Official summary · Nederlands

The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding of €1,000,000.—incl. VAT through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foundations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent…

What is being procured?
Deadline Not announced
Estimated value775,000 EUR
PublishedMay 22, 2026
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Official summary · Nederlands

What is being procured?

The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding of €1,000,000.—incl. VAT through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foundations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent diffractive imaging in both transmission and reflection geometries. The instrument must meet the following critical performance criteria: • High temporal and spatial coherence at accelerations voltages up to 30 keV and probe currents of 25–100 pA. • Compatibility with bulk samples exceeding 70 × 70 mm, with multiple secondary and back-scattered ele

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  1. Result notice Current notice

    · TED 352373-2026

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Data is restructured for easier reading. The official notice and procurement documents always prevail.

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TED · 352373-2026. Checked on Aug 22, 2026, 11:05 AM.

Data is restructured for easier reading. The official notice and procurement documents always prevail.

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