Oficiālais kopsavilkums · Nederlands
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The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding of €1,000,000.—incl. VAT through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foundations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent diffractive imaging in both transmission and reflection geometries. The instrument must meet the following critical performance criteria: • High temporal and spatial coherence at accelerations voltages up to 30 keV and probe currents of 25–100 pA. • Compatibility with bulk samples exceeding 70 × 70 mm, with multiple secondary and back-scattered ele
Informatīvs mašīntulkojums. Oficiālais kopsavilkums joprojām ir noteicošais.
Oficiālais kopsavilkums · Nederlands
The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding of €1,000,000.—incl. VAT through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foundations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent diffractive imaging in both transmission and reflection geometries. The instrument must meet the following critical performance criteria: • High temporal and spatial coherence at accelerations voltages up to 30 keV and probe currents of 25–100 pA. • Compatibility with bulk samples exceeding 70 × 70 mm, with multiple secondary and back-scattered ele
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