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Finska · Laboratorijska, optična in precizna oprema

Uradni naslov · English

Defect inspection system

VTT Technical Research Centre of Finland Ltd · Finska

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Uradni povzetek · English

VTT is looking to acquire an automated defect inspection tool for 200 mm and 300 mm patterned wafers. The tool will enable rapid tracking of defects that appear during the manufacturing process of functional devices (in-line and end-of-line in the Front-end process). The tool must be capable of detecting particles, voids, cracks, scratches, pits, bumps, and hazes in the pattern. The materials of the patterns that the machine must be able to analyze are…

Kaj je predmet naročila?
Rok 28. jul. 2026 13:00 UTC
Ocenjena vrednostNi navedeno
Objavljeno16. jun. 2026
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Uradni povzetek · English

Kaj je predmet naročila?

VTT is looking to acquire an automated defect inspection tool for 200 mm and 300 mm patterned wafers. The tool will enable rapid tracking of defects that appear during the manufacturing process of functional devices (in-line and end-of-line in the Front-end process). The tool must be capable of detecting particles, voids, cracks, scratches, pits, bumps, and hazes in the pattern. The materials of the patterns that the machine must be able to analyze are silicon oxides and nitrides, polysilicon, metals, and photoresist. The object of the tender process and the technical requirements are described in more detail in the invitation to tender documents.

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    · TED 413000-2026

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TED · 413000-2026. Preverjeno 23. avg. 2026 02:05.

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