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il-Finlandja · Tagħmir tal-laboratorju, ottiku u ta’ preċiżjoni

Titlu uffiċjali · English

Defect inspection system

VTT Technical Research Centre of Finland Ltd · il-Finlandja

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Sommarju uffiċjali · English

VTT is looking to acquire an automated defect inspection tool for 200 mm and 300 mm patterned wafers. The tool will enable rapid tracking of defects that appear during the manufacturing process of functional devices (in-line and end-of-line in the Front-end process). The tool must be capable of detecting particles, voids, cracks, scratches, pits, bumps, and hazes in the pattern. The materials of the patterns that the machine must be able to analyze are…

X’qed jiġi akkwistat?
Skadenza 28 Lul 2026 13:00 UTC
Valur stmatMhux imħabbar
Ippubblikat16 Ġun 2026
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Sommarju uffiċjali · English

X’qed jiġi akkwistat?

VTT is looking to acquire an automated defect inspection tool for 200 mm and 300 mm patterned wafers. The tool will enable rapid tracking of defects that appear during the manufacturing process of functional devices (in-line and end-of-line in the Front-end process). The tool must be capable of detecting particles, voids, cracks, scratches, pits, bumps, and hazes in the pattern. The materials of the patterns that the machine must be able to analyze are silicon oxides and nitrides, polysilicon, metals, and photoresist. The object of the tender process and the technical requirements are described in more detail in the invitation to tender documents.

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    · TED 413000-2026

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Sors u affidabbiltà

TED · 413000-2026. Iċċekkjat fil-23 Aww 2026 02:05.

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