Kelvin probe force microscopy (KPFM)

Virallinen yhteenveto · English

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The object of the tender process was a Kelvin probe force microscopy (KPFM) equipped with atomic force microscopy (AFM) functionality, a state-of-the-art detector system, and equipment for advanced material surface potential mapping with an efficient spatial resolution and a minimum of topographical artifacts (later also “Equipment”). The equipment supports both AM- and FM-KPFM modes, operate with a potential range up to ±10 V, with a reasonable spatial resolution. The applied voltage is from a few hundred millivolts to a few volts (approximately 1-2 V) for AC and DC, and the device is equipped with advanced control electronics and software for quantitative analysis. An integrated cooling and heating control with a large temperature range (from possibly -30°C up to +90°C) in both air and l

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