Semi-automated probe system with accessories

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The tender concerns the procurement of an integrated system for optical and opto-electrical characterization at wafer and chip level in the visible (VIS) spectral range. The system shall consist of a 200 mm semi-automated probe station equipped with a temperature-controlled chuck, microscope, and manual manipulators for RF/DC probes as well as for optical fibers and fiber arrays. The system will be installed in a laboratory environment outside the cleanroom. The scope of supply includes delivery to the point of use (laboratory), installation, commissioning, and two days of user training. The system must be new (no refurbished chambers or parts) and comply fully with CE requirements and the applicable EU Machinery Directive (2006/42/EC as amended). The operating system shall be Microsoft Wi

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