Det kommende udbud er opdelt i følgende delkontrakter, som afspejler Regionens forskellige behov for kapacitet og funktionalitet: Delkontrakt 1: Højkapacitetsglasscannere Delkontrakt 2: Mellemkapacitetsglasscannere Delkontrakt 3: Glasscannere til specialhistologi Delkontrakt 4: Glasscannere til cytologi Delkontrakt 5: Glasscannere til frysesnit Delkontrakt 6: Glasscannere til megasnit I forbindelse med kontraktindgåelsen vil der blive udfærdiget separat…
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10. nov. 2026 11:00 UTC
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ÅbenTEDDNK
Danmark · Laboratorie-, optisk og præcisionsudstyr
The tender concerns an Agreement for supply of equipment for Energy Hub. The tender concerns the supply, delivery, installation and commissioning of educational and demonstration equipment for the AAU Energy Hub. The Energy Hub will serve as a learning environment for university students, secondary schools, vocational education, teachers, companies, public authorities and visitors. The equipment shall support teaching, research, outreach activities and…
Officielt resumé · English
The tender concerns an Agreement for supply of equipment for Energy Hub. The tender concerns the supply, delivery, installation and commissioning of educational and demonstration equipment for the AAU Energy Hub. The Energy Hub will serve as a learning environment for university students, secondary schools, vocational education, teachers, companies, public authorities and visitors. The equipment shall support teaching, research, outreach activities and…
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and…
Officielt resumé · English
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and…
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